Stéphane Étienne

Historical perspective and current trends in emission microscopy, mirror electron microscopy and low-energy electron microscopy

A Free Electron Laser–Photoemission Electron Microscope System (FEL–PEEM)

A Survey of Projection-Based Model Reduction Methods for Parametric Dynamical Systems

Local improvements to reduced-order models using sensitivity analysis of the proper orthogonal decomposition

A continuous sensitivity equation method for time-dependent incompressible laminar flows

The sensitivity equation method in fluid mechanics

Automatic measurement of the work function variation on microsurfaces