Citation Impact
Citing Papers
Atomic Layer Deposition Chemistry: Recent Developments and Future Challenges
2003 Standout
High-mobility and low-power thin-film transistors based on multilayer MoS2 crystals
2012 Standout
Oxide Semiconductor Thin‐Film Transistors: A Review of Recent Advances
2012 Standout
Indium phosphide nanowires as building blocks for nanoscale electronic and optoelectronic devices
2001 StandoutNature
Memristive switching mechanism for metal/oxide/metal nanodevices
2008 Standout
The ReaxFF reactive force-field: development, applications and future directions
2016 Standout
Initial Reactions in Chemical Vapor Deposition of Ta2O5from TaCl5and H2O. An Ab Initio Study
2000
Electrical, structural and microstructural characteristics of as-deposited and annealed Pt and Au contacts on chemical-vapor-cleaned GaN thin films
2002 StandoutNobel
Atomic layer deposition of tungsten using sequential surface chemistry with a sacrificial stripping reaction
2000
Atomic Layer Deposition of Dielectrics on Ge and III–V Materials for Ultrahigh Performance Transistors
2009
Reflectance-difference spectroscopy of (001) GaAs surfaces in ultrahigh vacuum
1992
Modelling of inoculation of metallic melts: application to grain refinement of aluminium by Al–Ti–B
2000 Standout
Production and properties of high rate sputtered low index transparent dielectric materials based on aluminium-oxy-fluorine
1985
A review of Ga2O3 materials, processing, and devices
2018 Standout
Luminescence properties of defects in GaN
2005 Standout
The undercooling of aluminum
1987
RAPID MANUFACTURING AND RAPID TOOLING WITH LAYER MANUFACTURING (LM) TECHNOLOGIES, STATE OF THE ART AND FUTURE PERSPECTIVES
2003 Standout
Magnetic properties of Fe films and Fe∕Si∕Fe trilayers grown on GaAs(001) and MgO(001) by ion-beam sputter epitaxy
2006 StandoutNobel
Cleaning of AlN and GaN surfaces
1998 StandoutNobel
Surface photovoltage phenomena: theory, experiment, and applications
1999 Standout
Evaporated Sn-doped In2O3 films: Basic optical properties and applications to energy-efficient windows
1986 Standout
Atomic Layer Deposition: An Overview
2009 Standout
Conductivity behavior in polycrystalline semiconductor thin film transistors
1982
A reflectance anisotropy spectroscopy study of GaSb(100)c(2 × 6) surfaces prepared by Sb decapping
1996 StandoutNobel
An electrochemical impedance spectroscopy and polarization study of nanocrystalline Co and Co–P alloy in 0.1M H2SO4 solution
2005
Band Bending in Semiconductors: Chemical and Physical Consequences at Surfaces and Interfaces
2012 Standout
XPS Characterization of the Corrosion Films Formed on Nanocrystalline Ni-P Alloys in Sulphuric Acid
1996
Comparison of the temperature dependence of the properties of ion beam and magnetron sputtered Fe films on (100) GaAs
1999
Pd growth and subsequent Schottky barrier formation on chemical vapor cleaned p-type GaN surfaces
2002 StandoutNobel
Chemical, electrical, and structural properties of Ni/Au contacts on chemical vapor cleaned p-type GaN
2002 StandoutNobel
Atomically controlled growth of tungsten and tungsten nitride using sequential surface reactions
2000
Surface chemistry of atomic layer deposition: A case study for the trimethylaluminum/water process
2005 Standout
Chalcogenide passivation of III–V semiconductor surfaces
1998
Tantalum pentoxide (Ta2O5) thin films for advanced dielectric applications
1998
Magnetron sputtering of Fe onto GaAs substrates: Energetic bombardment effects
1992
X-ray photoelectron spectroscopy analysis of GaN/(0001)AlN and AlN/(0001)GaN growth mechanisms
1999 StandoutNobel
In situ cleaning of GaN/6H-SiC substrates in NH3
2001 StandoutNobel
X-ray photoelectron spectroscopy and x-ray diffraction study of the thermal oxide on gallium nitride
1997
Visible-light driven heterojunction photocatalysts for water splitting – a critical review
2015 Standout
Effect of Grain Size on Corrosion: A Review
2010 Standout
Microstructure, electrical properties, and thermal stability of Al ohmic contacts to n-GaN
1996 StandoutNobel
Microstructure, electrical properties, and thermal stability of Au-based ohmic contacts to p-GaN
1997 StandoutNobel
Metal–Oxide RRAM
2012 Standout
Cleaning of GaN surfaces
1996 StandoutNobel
Observation of highly dispersive surface states on GaN(0001)1×1
1999 StandoutNobel
Emerging Trends in Surface Metrology
2002
High-κ gate dielectrics: Current status and materials properties considerations
2001 Standout
Surface integrity in material removal processes: Recent advances
2011 Standout
Ion implanted dopants in GaN and AlN: Lattice sites, annealing behavior, and defect recovery
2000 StandoutNobel
Resistance switching of copper doped MoOx films for nonvolatile memory applications
2007
Works of S. Ingrey being referenced
Measurement of GaAs surface oxide desorption temperatures
1987
An x-ray photoelectron spectroscopy study on ozone treated InP surfaces
1987
Interfacial properties of metal–insulator–semiconductor capacitors on GaAs(110)
1995
I n s i t u x-ray photoelectron spectroscopic study of remote plasma enhanced chemical vapor deposition of silicon nitride on sulfide passivated InP
1990
Effects of substrate position and angle of incidence on the refractive index of sputtered, birefringent Ta2O5Nx films
1977
Surface charge spectroscopy—A novel surface science technique for measuring surface state distributions on semiconductors
1993
Variable refractive index and birefringent waveguides by sputtering tantalum in O_2–N_2 mixtures
1975
Effect of pressure on the properties of reactively sputtered Ta2O5
1974
Effect of thermal annealing on thin film transistors processed by photoengraving
1980
An x-ray photoelectron spectroscopy study on ozone treated GaAs surfaces
1986
Thermal diffusion of chromium in polycrystalline CdSe films
1980
High Resolution Auger Depth Profiles Using a Dual Ion Gun System
1985
III–V surface processing
1992
Scanning spreading resistance microscopy study of a metalorganic chemical vapor deposited grown InP optoelectronic structure
2001
Controlling surface band-bending of InP with polysulfide treatments
1992
Capping and decapping of InP and InGaAs surfaces
1990
Artifacts observed during Auger profiling of Ta, Ti, and W metals, nitrides and oxynitrides
1982