Citation Impact
Citing Papers
High-resolution noise substitution to measure overfitting and validate resolution in 3D structure determination by single particle electron cryomicroscopy
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Norm theory: Comparing reality to its alternatives.
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Measurement of the silicon (220) lattice spacing
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2000
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An Introduction to Econophysics: Correlations and Complexity in Finance
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Pressure-Induced High-Spin to Low-Spin Transition in FeS Evidenced by X-Ray Emission Spectroscopy
1999 StandoutNobel
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1993
A new determination of N/sub A/
1995
Probing surface and interface morphology with Grazing Incidence Small Angle X-Ray Scattering
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Enhanced modulation bandwidth for strain-compensated InGaAlAs-InGaAsP MQW lasers
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About the existing discrepancy in the determinations of the Avogadro constant
1999
Theory of the hydrogen-deuterium isotope shift
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1990
Bioinspired Metal–Organic Framework Catalysts for Selective Methane Oxidation to Methanol
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1997
Layer-by-layer self-assembly of supramolecular and biomolecular films
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Recommended treatment of precision measurements related to nuclear energy levels and atomic masses
1983
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2005 StandoutNobel
Scanning X-ray interferometry over a millimeter baseline
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A Capacitance Standard Based on Counting Electrons
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NBS determination of the fine-structure constant, and of the quantized Hall resistance and Josephson frequency-to-voltage quotient in SI units
1989 StandoutNobel
Silicon lattice measurement with an improved X-ray/optical interferometer
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1991
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2000 StandoutNobel
Precision measurement of the 1Sground-state Lamb shift in atomic hydrogen and deuterium by frequency comparison
1995 StandoutNobel
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2008
Determination of the Avogadro constant by accurate measurement of the molar volume of a silicon crystal
1999
Support theory: A nonextensional representation of subjective probability.
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The 1986 adjustment of the fundamental physical constants
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Remeasurement of a Silicon lattice period
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2004 StandoutNobel
New determination of the deuteron binding energy and the neutron mass
1986
4,4″‐Disubstituted Terpyridines and Their Homoleptic FeII Complexes
2013 StandoutNobel
The lattice parameter of highly pure silicon single crystals
1982
Precision measurement of
1989
Works of Rolf Lauer being referenced
Absolute Measurement of the (220) Lattice Plane Spacing in a Silicon Crystal
1981
The effect of non-isoplanatism in micrographs taken with an electron microscope equipped with a field emission gun
1985
Characterization of the dynamics of semiconductor lasers using optical modulation
1992
Interfacial roughness and related growth mechanisms in sputtered W/Si multilayers
1996