Citation Impact
Citing Papers
Dynamic emission Stokes shift and liquid-like dielectric solvation of band edge carriers in lead-halide perovskites
2019 StandoutNobel
Characterization of zirconium nitride coatings deposited by cathodic arc sputtering
1998 StandoutNobel
Physical metallurgy of Ti–Ni-based shape memory alloys
2005 Standout
ELECTROMIGRATION IN SINGLE-CRYSTAL ALUMINUM FILMS
1970
Equation of state of the rocksalt phase of III–V nitrides to 72 GPa or higher
1997 StandoutNobel
Formation of aluminium thin films in the presence of oxygen and nickel
1979
X-ray diffraction under ultrahigh pressure generated with sintered diamond anvils
1986 StandoutNobel
Ewald summation techniques in perspective: a survey
1996 Standout
The third-order elastic constants of potassium chloride, sodium chloride and lithium fluoride
1967
Low energy ion-assisted deposition of titanium nitride ohmic contacts on alpha (6H)-silicon carbide
1991 StandoutNobel
Anharmonic crystals
1968
An (Al,Ga)As/GaAs heterostructure bipolar transistor with nonalloyed graded-gap ohmic contacts to the base and emitter
1987 StandoutNobel
The elastic constants of a cubic crystal subjected to moderately high hydrostatic pressure
1968
Interstitial Diffusion of Copper in Tin
1967 Standout
Thermoelasticity of Stressed Materials and Comparison of Various Elastic Constants
1967
The diffusion of gold in lead single crystals
1966
Equation of state of NaCl: Ultrasonic measurements to 8 kbar and 800°C and static lattice theory
1972
Nonmetallic crystals with high thermal conductivity
1973 Standout
Synthesis and properties of polyimide–clay hybrid
1993 Standout
Theoretical strength of a perfect crystal with exponentially attractive and repulsive interatomic interactions
1973
The use of titanium-based contact barrier layers in silicon technology
1982
Structural and electrical properties of NiAs-type compounds under pressure
1999 StandoutNobel
Polyimide insulators for multilevel interconnections
1981
Semiconducting and other major properties of gallium arsenide
1982 Standout
High-temperature contact structures for silicon semiconductor devices
1980
Effect of Redundant Microstructure on Electromigration-Induced Failure
1971
Anharmonicity in Noble Metals; Higher Order Elastic Constants
1966
Second pressure derivatives of the second-order elastic constants of some alkali halides
1988
Electromigration and failure in electronics: An introduction
1971
Review of Some Experimental and Analytical Equations of State
1969
Self-consistent-charge density-functional tight-binding method for simulations of complex materials properties
1998 Standout
RESISTANCE MONITORING AND EFFECTS OF NONADHESION DURING ELECTROMIGRATION IN ALUMINUM FILMS
1968
Finite strain isotherm and velocities for single‐crystal and polycrystalline NaCl at high pressures and 300°K
1978 Standout
Electromigration in Al/Si contacts—Induced open-circuit failure
1986
Electromigration Damage in Aluminum Film Conductors
1970
Polymorphic transitions in single crystals: A new molecular dynamics method
1981 Standout
Low dielectric constant polymers for microelectronics
2001 Standout
Electromigration in metals
1989 Standout
Interionic potentials in alkali halides and their use in simulations of the molten salts
1976
Ultrasonic parameters in the born model of the sodium and potassium halides
1970
The second- and third-order elastic constants of sodium chloride at 295 K
1967
Grain-boundary electromigration in thin films II. Tracer measurements in pure Au
1977
Applicability of exponentially attractive and repulsive interactomic potential functions in the description of cubic crystals
1973
An improved and extended internally consistent thermodynamic dataset for phases of petrological interest, involving a new equation of state for solids
2011 Standout
Elastic constants as they relate to lattice properties and martensite formation
1980
Crystal Dynamics of Copper
1967 StandoutNobel
A model for conductor failure considering diffusion concurrently with electromigration resulting in a current exponent of 2
1986
Electromigration—A brief survey and some recent results
1969 Standout
Effective Pair Potentials of NaCl- and CsCl-type KBr Determined by X-Ray Absorption Fine Structure under Pressure
1998 StandoutNobel
A direct measurement of interfacial contact resistance
1982
Microstructural evolution during film growth
2003 Standout
Electromigration in Thin Al Films
1969
A new method of absolute high pressure determination
1973
Interconnections in VLSI
1986
Phase transitions and equations of state for the sodium halides: NaF NaCl, NaBr, and NaI
1983
First-principles calculations of impurity diffusion coefficients in dilute Mg alloys using the 8-frequency model
2011
Reducing Vehicle Weight and Improving U.S. Energy Efficiency Using Integrated Computational Materials Engineering
2012 Standout
Simple model for structural properties and crystal stability ofsp-bonded solids
1987
Recent advances on electromigration in very-large-scale-integration of interconnects
2003 Standout
Transport properties of a two-dimensional electron system at even-denominator fillings of the lowest Landau level
1992 StandoutNobel
Electromigration Failure at Aluminum-Silicon Contacts
1972
Second- and Higher-Order Effective Elastic Constants of Cubic Crystals under Hydrostatic Pressure
1968
Compressibility of 27 halides to 45 kbar
1971
Works of P. B. Ghate being referenced
Concerning electromigration in thin films
1971
SOME OBSERVATIONS ON THE ELECTROMIGRATION IN ALUMINUM FILMS
1967
Pressure Derivatives of the Elastic Constants of NaBr and KF
1967
Electromigration testing of Ti: W/Al and Ti: W/Al-Cu film conductors
1978
Fourth-Order Elastic Coefficients
1964
Screened Interaction Model for Impurity Diffusion in Zinc
1964
ELECTROMIGRATION-INDUCED FAILURES IN ALUMINUM FILM CONDUCTORS
1970
Morse-Potential Evaluation of Second- and Third-Order Elastic Constants of Some Cubic Metals
1967
Third-Order Elastic Constants of Alkali Halide Crystals
1965
Effect of Hydrostatic Pressure on the Elastic Behavior of Cubic Crystals
1966
Elastic constants of some NaCl type alkali halides
1966
Metallization in microelectronics
1977
Application of Ti: W barrier metallization for integrated circuits
1978
Electromigration-Induced Failures in, and Microstructure and Resistivity of, Sputtered Gold Films
1972