N. Fourches

Electronic detectors for electron microscopy

Chemically Derived Graphene Oxide: Towards Large‐Area Thin‐Film Electronics and Optoelectronics

Thermal properties of graphene and nanostructured carbon materials

Electron imaging with Medipix2 hybrid pixel detector

Radiation-induced soft errors in advanced semiconductor technologies

2D Detectors for particle physics and for imaging applications

Deposition of thin organosilicon polymer films in atmospheric pressure glow discharge

A strategy to overcome the limits of carbon-based materials as lithium-ion battery anodes

Basic mechanisms and modeling of single-event upset in digital microelectronics

Diamond-like amorphous carbon

Single-event effects in SOI technologies and devices

A novel position and time sensing active pixel sensor with field-assisted electron collection for charged particle tracking and electron microscopy

Raman spectroscopy of amorphous, nanostructured, diamond–like carbon, and nanodiamond

Plasma assisted ignition and combustion

BUSFET-a radiation-hardened SOI transistor

Determining hybridization differences for amorphous carbon from the XPS C 1s envelope

Surface relaxation during plasma-enhanced chemical vapor deposition of hydrocarbon films, investigated by in situ ellipsometry

The state of understanding of the lithium-ion-battery graphite solid electrolyte interphase (SEI) and its relationship to formation cycling

Ion-Catalyzed Synthesis of Microporous Hard Carbon Embedded with Expanded Nanographite for Enhanced Lithium/Sodium Storage

Surface and plasma simulation of deposition processes: CH4 plasmas for the growth of diamondlike carbon

Industrial Applications of Pulsed Power Technology

Radiation Effects in MOS Oxides

Radiation effects on SOI analog devices parameters

Study of a CMOS-JFET-bipolar radiation hard analog-digital technology suitable for high energy physics electronics

Monolithic active pixel sensors with in-pixel double sampling operation and column-level discrimination

A fast monolithic active pixel sensor with pixel-level reset noise suppression and binary outputs for charged particle detection

Study of DLC/silicon interfaces by XPS and in-situ ellipsometry

Plasma deposition of hydrogenated amorphous carbon: growth rates, properties and structures