Mathias Rommel

Fundamentals and advances in magnesium alloy corrosion

Large volume serial section tomography by Xe Plasma FIB dual beam microscopy

Quantitative analyses of enhanced thermoelectric properties of modulation-doped PEDOT:PSS/undoped Si (001) nanoscale heterostructures

The roles of photo-carrier doping and driving wavelength in high harmonic generation from a semiconductor

Non-destructive reversible resistive switching in Cr doped Mott insulator Ca2RuO4: Interface vs bulk effects

Review: Developments in micro/nanoscale fabrication by focused ion beams

A review on 3D micro-additive manufacturing technologies

Two-photon direct laser writing of ultracompact multi-lens objectives

Extraction of solar cell parameters from a single current–voltage characteristic using teaching learning based optimization algorithm

Advanced Thermoelectric Design: From Materials and Structures to Devices

Metal oxide resistive memory switching mechanism based on conductive filament properties

Comparative performance on photovoltaic model parameter identification via bio-inspired algorithms

Parameters identification of photovoltaic models using an improved JAYA optimization algorithm

A general and precise method to evaluate the series resistance of photovoltaic cells from I-V characteristics

Colloquium: Strong-field phenomena in periodic systems

Fabrication of refractive freeform array masters for artificial compound eye cameras

Metal–Oxide RRAM

Tailored semiconductors for high-harmonic optoelectronics

Concentrating Properties of Nitride-Based Solar Cells Using Different Electrodes

Structural and Optical Properties of Silicon Carbide Powders Synthesized from Organosilane Using High-Temperature High-Pressure Method

Parameter extraction of solar photovoltaic modules using penalty-based differential evolution

Junction formation and current transport mechanisms in hybrid n-Si/PEDOT:PSS solar cells

Comprehensive study of focused ion beam induced lateral damage in silicon by scanning probe microscopy techniques

Topic Review: Application of Raman Spectroscopy Characterization in Micro/Nano-Machining

Accurate parameter extraction for the simulation of direct structuring by ion beams

Full wafer microlens replication by UV imprint lithography

The influence of the measurement environment on the accuracy of the extraction of the physical parameters of solar cells

Tunneling atomic-force microscopy as a highly sensitive mapping tool for the characterization of film morphology in thin high-k dielectrics