M. J. Sullivan

Basic mechanisms and modeling of single-event upset in digital microelectronics

A Novel CMOS SRAM Feedback Element for SEU Environments

Critical evaluation of the status of the areas for future research regarding the wide band gap semiconductors diamond, gallium nitride and silicon carbide

High-temperature point-contact transistors and Schottky diodes formed on synthetic boron-doped diamond

Low-energy antimony implantation in silicon

Hole-trapping effects in reverse-biased Si-doped Al Schottky-barrier diodes