Citation Impact
Citing Papers
On the Proteaceae-the evolution and classification of a southern family*
1975
SEU simulation and testing of resistor-hardened D-latches in the SA3300 microprocessor
1991
Radiation-induced soft errors in advanced semiconductor technologies
2005 Standout
A simple estimate of funneling-assisted charge collection
1991
Impact of technology trends on SEU in CMOS SRAMs
1996
The design of radiation-hardened ICs for space: a compendium of approaches
1988
Basic mechanisms and modeling of single-event upset in digital microelectronics
2003 Standout
Soft error protection using asymmetric response latches
1991
Cosmic and terrestrial single-event radiation effects in dynamic random access memories
1996
Analysis of multiple bit upsets (MBU) in CMOS SRAM
1996
Fossil pollen records of extant angiosperms
1981 Standout
An SEU resistant 256 K SOI SRAM
1992
Comparison of experimental charge collection waveforms with PISCES calculations
1991
An Improved Single Event Resistive-Hardening Technique for CMOS Static RAMS
1986
Device simulation of charge collection and single-event upset
1996
Investigation of single-event upset (SEU) in an advanced bipolar process
1988
Three-dimensional simulation of charge collection and multiple-bit upset in Si devices
1994
Single event mirroring and DRAM sense amplifier designs for improved single-event-upset performance
1994
A radiation-hardened 16/32-bit microprocessor
1989
Terminal Guidance System for Satellite Rendezvous
1960 Standout
Perturbed volume of orbiting debris
1994
The space radiation environment for electronics
1988 Standout
Upset hardened memory design for submicron CMOS technology
1996 Standout
Works of L. S. Smith being referenced
New Species of and Notes on Queensland Plants, V
1969
Single Event Upset Immune Integrated Circuits for Project Galileo
1985
Update on parts SEE suspectibility from heavy ions
1991
Overview Of Device See Susceptibility From Heavy Ions
2005
Heavy ion induced Single Event Phenomena (SEP) data for semiconductor devices from engineering testing
1988
Experimental Evidence for a New Single-Event Upset (SEU) Mode in a CMOS SRAM Obtained from Model Verification
1987
Recent Trends in Parts SEU Susceptibility from Heavy Ions
1987
Response of a DRAM to single-ion tracks of different heavy-ion species and stopping powers
1990
Temperature and Epi Thickness Dependence of the Heavy Ion Induced Latchup Threshold for a CMOS/EPI 16K Static RAM
1987
Characterization of multiple-bit errors from single-ion tracks in integrated circuits
1989
Single-Event Upset (SEU) Model Verification and Threshold Determination Using Heavy Ions in a Bipolar Static RAM
1985
Experimental Determination of Single-Event Upset (SEU) as a Function of Collected Charge in Bipolar Integrated Circuits
1984