Citation Impact

Citing Papers

Principles and applications of ion beam techniques for the analysis of solids and thin films
1973
Gated Electron Sharing Within Dynamic Naphthalene Diimide‐Based Oligorotaxanes
2014 StandoutNobel
The V-groove multijunction solar cell
1979
EPR of conduction electrons produced in silicon by hydrogen ion implantation
1974
Comparison of leakage currents in ion-implanted and diffused p-n junctions
1975
Observation of ‘third sound’ in superfluid 3He
1998 Nature
The influence of ion implantation on the thermal oxidation of copper
1983 StandoutNobel
Strongly coupled plasmas: high-density classical plasmas and degenerate electron liquids
1982 Standout
Effect of Lattice Mismatch on Electric Properties near Heterointerface of InxGa1-xAsyP1-y(y<0.01)/(100) GaAs
1988 StandoutNobel
Extrinsic gettering via the controlled introduction of misfit dislocations
1985 StandoutNobel
Image-Potential-Induced Surface Bands in Insulators
1969
The role of radiation damage on the current-voltage characteristics of p-n junctions
1974
Zn gettering in InGaAs/InP interfaces
1986
Interaction of positron beams with surfaces, thin films, and interfaces
1988 Standout
A review of nuclear batteries
2014 Standout
Silicon as a mechanical material
1982 Standout
Hydrogen interactions with defects in crystalline solids
1992 Standout
Fundamentals of Modern VLSI Devices
2009 Standout
Critical microstructure for ion-implantation gettering effects in silicon
1977
Dipole layers at the metal-SiO2 interface
1980
Electronic properties of two-dimensional systems
1982 Standout

Works of K.A. Pickar being referenced

Critical Velocity of a Superflowing Liquid-Helium Film Using Third Sound
1969
Gettering rates of various fast-diffusing metal impurities at ion-damaged layers on silicon
1972
ELECTRON PARAMAGNETIC RESONANCE IN ION IMPLANTED SILICON
1969
Carrier transport and storage effects in Au ion implanted SiO2 structures
1972
Lifetime effects in ion implanted silicon
1970
Surface Waves on Bulk Liquid Helium
1969
Electrical Properties of Silicon Diode Array Camera Targets Made by Boron Ion Implantation
1971
A rutherford scattering study of the diffusion of heavy metal impurities in silicon to ion-damaged surface layers
1973
Rankless by CCL
2026