Citation Impact
Citing Papers
Serial Block-Face Scanning Electron Microscopy to Reconstruct Three-Dimensional Tissue Nanostructure
2004 Standout
Radiation-induced soft errors in advanced semiconductor technologies
2005 Standout
Infrared readout electronics for space-science sensors: state of the art and future directions
1993
The design of radiation-hardened ICs for space: a compendium of approaches
1988
Basic mechanisms and modeling of single-event upset in digital microelectronics
2003 Standout
Total ionizing dose effects in MOS oxides and devices
2003 Standout
Single-event effects in SOI technologies and devices
1996
Analysis of multiple bit upsets (MBU) in CMOS SRAM
1996
Ground test characterization of the multiband imaging photometer for SIRTF (MIPS)
2003
Mission Concept for the Single Aperture Far-Infrared (SAFIR) Observatory
2004 StandoutNobel
Single particle-induced latchup
1996
Response of 100% internal quantum efficiency silicon photodiodes to 200 eV-40 keV electrons
1997
Device simulation of charge collection and single-event upset
1996
Three-dimensional simulation of charge collection and multiple-bit upset in Si devices
1994
Infrared detectors: status and trends
2003 Standout
Single-word multiple-bit upsets in static random access devices
1993
On the suitability of non-hardened high density SRAMs for space applications
1991
Radiation Effects in MOS Oxides
2008 Standout
Destructive single-event effects in semiconductor devices and ICs
2003
Upset hardened memory design for submicron CMOS technology
1996 Standout
Works of J.S. Cable being referenced
One gigarad passivating nitrided oxides for 100% internal quantum efficiency silicon photodiodes
1993
The Size Effect of Ion Charge Tracks on Single Event Multiple-Bit Upset
1987
Optimization of cryogenic CMOS processes for sub-10°K applications
1992
Experimental and analytical investigation of single event, multiple bit upsets in poly-silicon load, 64 K*1 NMOS SRAMs
1988
Parametric investigation of latch-up sensitivity in 1.25 μm CMOS technology
1987
The Dependence of Latch-Up Sensitivity on Layout Features in CMOS Integrated Circuits
1986