Jerzy Tyszer

VLSI Test Principles and Architectures: Design for Testability

Survey of Test Vector Compression Techniques

Variable-length input huffman coding for system-on-a-chip test

XPAND: an efficient test stimulus compression technique

Diagnosis of scan cells in BIST environment

Embedded deterministic test for low-cost manufacturing

Ring Generators—New Devices for Embedded Test Applications

Finite memory test response compactors for embedded test applications

Test data decompression for multiple scan designs with boundary scan

Embedded Deterministic Test