Citation Impact
Citing Papers
Memristive switching mechanism for metal/oxide/metal nanodevices
2008 Standout
Technology and metrology of new electronic materials and devices
2007
Laser material processing
2011 Standout
Future on Power Electronics for Wind Turbine Systems
2013 Standout
Laser processing of materials
2003 Standout
Condition Monitoring for Device Reliability in Power Electronic Converters: A Review
2010
A Survey on Wind Turbine Condition Monitoring and Fault Diagnosis—Part I: Components and Subsystems
2015 Standout
Embedded System Design
2010 Standout
Laser beam machining—A review
2007 Standout
Fundamentals of Modern VLSI Devices
2009 Standout
Ultrathin gate oxide reliability: physical models, statistics, and characterization
2002
Radiation Effects in MOS Oxides
2008 Standout
An Industry-Based Survey of Reliability in Power Electronic Converters
2011 Standout
Works of J.B. Bernstein being referenced
Spatial distributions of trapping centers in HfO2∕SiO2 gate stacks
2006
Reliability of ultrathin silicon dioxide under combined substrate hot-electron and constant voltage tunneling stress
2000
Time-dependent breakdown of ultra-thin SiO2 gate dielectrics under pulsed biased stress
2001
Analysis of laser metal-cut energy process window
2000
Observation of latent reliability degradation in ultrathin oxides after heavy-ion irradiation
2002
Electronic circuit reliability modeling
2006
Heavy-ion-induced soft breakdown of thin gate oxides
2001