J. Krieg

Effects of radiation and charge trapping on the reliability of high- κ gate dielectrics

Radiation-induced soft errors in advanced semiconductor technologies

Elimination of Enhanced Low-Dose-Rate Sensitivity in Linear Bipolar Devices Using Silicon-Carbide Passivation

Function composites materials for shielding applications: Correlation between phase separation and attenuation properties

Low field leakage current and soft breakdown in ultra-thin gate oxides after heavy ions, electron or X-ray irradiation

Total ionizing dose effects in MOS oxides and devices

Research of the shielding effect and radiation resistance of composite CuBi2O4 films as well as their practical applications

Effects of hydrogen transport and reactions on microelectronics radiation response and reliability

Total ionizing dose effects in bipolar devices and circuits

Characterization of enhanced low dose rate sensitivity (ELDRS) effects using Gated Lateral PNP transistor structures

Precursor ion damage and angular dependence of single event gate rupture in thin oxides

Lest we remember

Nature of Interface Defect Buildup in Gated Bipolar Devices Under Low Dose Rate Irradiation

Passivation layers for reduced total dose effects and ELDRS in linear bipolar devices

A model of radiation induced leakage current (RILC) in ultra-thin gate oxides

Thermal-stress effects and enhanced low dose rate sensitivity in linear bipolar ICs

Heavy ion irradiation of thin gate oxides

Radiation Effects in MOS Oxides

Analysis of radiation effects on individual DRAM cells

Destructive single-event effects in semiconductor devices and ICs

Heavy-ion-induced breakdown in ultra-thin gate oxides and high-k dielectrics

Evaluation of proposed hardness assurance method for bipolar linear circuits with enhanced low dose rate sensitivity (ELDRS)

Identification of degradation mechanisms in a bipolar linear voltage comparator through correlation of transistor and circuit response

Enhanced low dose rate sensitivity (ELDRS) of linear circuits in a space environment

Origins of total-dose response variability in linear bipolar microcircuits

Enhanced low dose rate sensitivity (ELDRS) in a voltage comparator which only utilizes complementary vertical NPN and PNP transistors

Total-dose hardening of a bipolar-voltage comparator

Effect of ion energy upon dielectric breakdown of the capacitor response in vertical power MOSFETs

Hardness assurance implications of bimodal total dose response in a bipolar linear voltage comparator

First observations of enhanced low dose rate sensitivity (ELDRS) in space: One part of the MPTB experiment