Immediate Impact
2 hit
Citing Papers
Point defects and dopant diffusion in silicon
1989 Hit
Charge collection scanning electron microscopy
1982 Hit
Works of Hisayuki Higuchi being referenced
Observations of Channels of MOS Field Effect Transistors Using a Scanning-Electron Microscope
1965
Measurement of the Lifetime of Minority Carriers in Semiconductors with a Scanning Electron Microscope
1965