E. Koppensteiner

Microstructure of heteroepitaxial GaN revealed by x-ray diffraction

Nanoparticles for photothermal therapies

Luminescence Bands and their Proposed Origins In Highly Porous Silicon

Epitaxial growth of GaN by radical-enhanced metalorganic chemical vapor deposition (REMOCVD) in the downflow of a very high frequency (VHF) N2/H2 excited plasma – effect of TMG flow rate and VHF power

Structure and correlations in porous silicon studied by X-ray scattering methods

The emergence and prospects of deep-ultraviolet light-emitting diode technologies

Plastic relaxation and relaxed buffer layers for semiconductor epitaxy

The structural and luminescence properties of porous silicon

High Figure of Merit in Nanostructured n-Type KPb_mSbTe_m+2 Thermoelectric Materials

The use of synchrotron radiation techniques in the characterization of strained semiconductor heterostructures and thin films

Dislocations in AlN Epilayers Grown on Sapphire Substrate by High-Temperature Metal-Organic Vapor Phase Epitaxy

Morphology and Luminescence of p‐Doped Porous Silicon

Hexagonal pore arrays with a 50–420 nm interpore distance formed by self-organization in anodic alumina

High-performance nanostructured thermoelectric materials

Electronic States and Luminescence in Porous Silicon Quantum Dots: The Role of Oxygen

Bulk nanostructured materials from severe plastic deformation

Compositionally graded relaxed AlGaN buffers on semipolar GaN for mid-ultraviolet emission

Study of the cracking of highly porous p+ type silicon during drying

X-ray diffraction of III-nitrides

Effect of threading dislocations on the Bragg peakwidths of GaN, AlGaN, and AlN heterolayers

Disclosing the Complex Structure of UiO-66 Metal Organic Framework: A Synergic Combination of Experiment and Theory

Molecular beam epitaxy of PbTe/EuTe superlattices and their structural investigation by x-ray diffraction using reciprocal space mapping

Analysis of strain and mosaicity in a short-period Si9Ge6 superlattice by x-ray diffraction

X-ray double and triple crystal diffractometry of mosaic structure in heteroepitaxial layers

X-ray diffraction investigation of single step and step-graded SiGe alloy buffers for the growth of short-period SimGen superlattices using reciprocal space mapping

Determination of threading dislocation density in hetero-epitaxial layers by diffuse X-ray scattering

Evolution of strain relaxation in compositionally graded Si1−xGex films on Si(001)

Diffuse x-ray scattering from p+ porous silicon by triple axis diffractometry

Investigation of strain-symmetrized and pseudomorphic SimGen superlattices by x-ray reciprocal space mapping