David Cooper

“Stretching” the energy landscape of oxides—Effects on electrocatalysis and diffusion

Tunnel field-effect transistors as energy-efficient electronic switches

Two-dimensional quantitative mapping of arsenic in nanometer-scale silicon devices using STEM EELS–EDX spectroscopy

Electron tomography and holography in materials science

Activating and optimizing MoS2 basal planes for hydrogen evolution through the formation of strained sulphur vacancies

A review on fundamentals for designing oxygen evolution electrocatalysts

Secondary electron imaging of nanostructures using Extreme Ultra‐Violet attosecond pulse trains and Infra‐Red femtosecond pulses

Tuning perovskite oxides by strain: Electronic structure, properties, and functions in (electro)catalysis and ferroelectricity

Silicon Nanowire Tunnel FETs: Low-Temperature Operation and Influence of High- $k$ Gate Dielectric

Robust excitons inhabit soft supramolecular nanotubes

Synthesis of MoS₂ and MoSe₂ Films with Vertically Aligned Layers

Controlling the Synthesis and Assembly of Silver Nanostructures for Plasmonic Applications

Rationally Designing High-Performance Bulk Thermoelectric Materials

Nanoscale Free-Carrier Profiling of Individual Semiconductor Nanowires by Infrared Near-Field Nanoscopy

Applications of 2D MXenes in energy conversion and storage systems

Advanced electron microscopy for thermoelectric materials

Surface Chemistry, Structure, and Electronic Properties from Microns to the Atomic Scale of Axially Doped Semiconductor Nanowires

Inorganic Solid-State Electrolytes for Lithium Batteries: Mechanisms and Properties Governing Ion Conduction

Quantitative off‐axis electron holography of GaAs p‐n junctions prepared by focused ion beam milling

Strain measurement at the nanoscale: Comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography

Mapping Active Dopants in Single Silicon Nanowires Using Off-Axis Electron Holography

Medium resolution off-axis electron holography with millivolt sensitivity

The influence of electron irradiation on electron holography of focused ion beam milled GaAs p-n junctions

Improvement in electron holographic phase images of focused-ion-beam-milled GaAs and Si p-n junctions by in situ annealing