Daniel Franta

Gwyddion: an open-source software for SPM data analysis

Atomic force microscopy analysis of nanoparticles in non-ideal conditions

Neutrophils contribute to muscle injury and impair its resolution after lengthening contractions in mice

Ellagitannin Consumption Improves Strength Recovery 2-3 d after Eccentric Exercise

Polymer–Fullerene Bulk‐Heterojunction Solar Cells

Theoretical analysis of the atomic force microscopy characterization of columnar thin films

Evidence of a contralateral repeated bout effect after maximal eccentric contractions

DLS and zeta potential – What they are and what they are not?

Raman Spectroscopy of Biological Tissues

Do All Carbonized Charcoals Have the Same Chemical Structure? 2. A Model of the Chemical Structure of Carbonized Charcoal

Hierarchically porous materials: synthesis strategies and structure design

Poly(ethylene oxide) Layers Grafted to Dopamine-melanin Anchoring Layer: Stability and Resistance to Protein Adsorption

The adhesion of normal human dermal fibroblasts to the cyclopropylamine plasma polymers studied by holographic microscopy

Surface chemistry of atomic layer deposition: A case study for the trimethylaluminum/water process

Polydopamine Surface Chemistry: A Decade of Discovery

Laser desorption–ionization time of flight mass spectrometry of various carbon materials

Synthesis of Biomorphous Nickel Oxide from a Pinewood Template and Investigation on a Hierarchical Porous Structure

Polymer‐Fullerene Bulk‐Heterojunction Solar Cells

Quantitative analysis of hydrogenated diamondlike carbon films by visible Raman spectroscopy

Quantitative phase imaging in biomedicine

On the efficiency of polymer solar cells

Atomic Layer Deposition of Hafnium Dioxide Films from Hafnium Hydroxylamide and Water

Polydopamine-modified nanocrystalline diamond thin films as a platform for bio-sensing applications

Comparison of effective medium approximation and Rayleigh–Rice theory concerning ellipsometric characterization of rough surfaces

Optical characterization of inhomogeneous thin films of ZrO2 by spectroscopic ellipsometry and spectroscopic reflectometry

Complete optical characterization of the SiO ₂ /Si system by spectroscopic ellipsometry, spectroscopic reflectometry and atomic force microscopy

Influence of lateral dimensions of the irregularities on the optical quantities of rough surfaces

Optical properties of NiO thin films prepared by pulsed laser deposition technique

Optical characterization of diamond-like carbon films using multi-sample modification of variable angle spectroscopic ellipsometry

The influence of substrate emissivity on plasma enhanced CVD of diamond-like carbon films

Influence of overlayers on determination of the optical constants of ZnSe thin films

Analysis of inhomogeneous thin films of ZrO ₂ by the combined optical method and atomic force microscopy

Characterization of the boundaries of thin films of TiO ₂ by atomic force microscopy and optical methods

Analysis of the boundaries of ZrO ₂ and HfO ₂ thin films by atomic force microscopy and the combined optical method

Variable-angle spectroscopic ellipsometry of considerably non-uniform thin films