Citation Impact
Citing Papers
Effects of radiation and charge trapping on the reliability of high- κ gate dielectrics
2004
Radiation-induced soft errors in advanced semiconductor technologies
2005 Standout
Soft Errors Induced by Energetic Protons
1979
Impact of technology trends on SEU in CMOS SRAMs
1996
Alpha-particle-induced soft errors in dynamic memories
1979
The design of radiation-hardened ICs for space: a compendium of approaches
1988
Cosmic ray soft error rates of 16-Mb DRAM memory chips
1998
Basic mechanisms and modeling of single-event upset in digital microelectronics
2003 Standout
Shapes of Inhomogeneously Broadened Resonance Lines in Solids
1969 Standout
On the use of SRIM for computing radiation damage exposure
2013 Standout
Dislocations, Point-Defect Clusters, and Cavities in Neutron Irradiated LiF Crystals
1958
Total ionizing dose effects in MOS oxides and devices
2003 Standout
Single-event effects in SOI technologies and devices
1996
The Displacement of Atoms in Solids by Radiation
1955 Standout
Cosmic Ray Induced in MOS Memory Cells
1978
On-Orbit Observations of Single Event Upset in Harris HM-6508 1K RAMS
1986
Evidence for angular effects in proton-induced single-event upsets
2002
Changes in Macroscopic Shape, Lattice Parameter, and Density in Crystals Due to Point Defects
1960
Cosmic and terrestrial single-event radiation effects in dynamic random access memories
1996
Simulation of Cosmic-Ray Induced Soft Errors and Latchup in Integrated-Circuit Computer Memories
1979
Low power SEU immune CMOS memory circuits
1992
SEU hardened memory cells for a CCSDS Reed-Solomon encoder
1991
Single-event effects experienced by astronauts and microelectronic circuits flown in space
1996
Mechanical Properties of Solid Polymers
1966 Standout
Dislocation Velocities, Dislocation Densities, and Plastic Flow in Lithium Fluoride Crystals
1959 Standout
The effect of cosmic rays on the soft error rate of a DRAM at ground level
1994
Device simulation of charge collection and single-event upset
1996
Three-dimensional simulation of charge collection and multiple-bit upset in Si devices
1994
Single Event Upset of Dynamic Rams by Neutrons and Protons
1979
Some physical properties of diamonds
1956
Radiation effects in SOI technologies
2003
Radiation Effects in MOS Oxides
2008 Standout
Destructive single-event effects in semiconductor devices and ICs
2003
Upset hardened memory design for submicron CMOS technology
1996 Standout
Works of D. Binder being referenced
Theory of Single Event Latchup in Complementary Metal-Oxide Semiconductor Integrated Circuits
1986
Annealing Process in Neutron-Irradiated LiF
1955
Temperature and Epi Thickness Dependence of the Heavy Ion Induced Latchup Threshold for a CMOS/EPI 16K Static RAM
1987
Satellite Anomalies from Galactic Cosmic Rays
1975
Equivalence of X-Ray Lattice Parameter and Density Changes in Neutron-Irradiated LiF
1954
Expansion of LiF under Neutron Irradiation
1957