Citation Impact
Citing Papers
Shedding light onto live molecular targets
2003 Standout
Nonlinear magic: multiphoton microscopy in the biosciences
2003 Standout
Surpassing the lateral resolution limit by a factor of two using structured illumination microscopy
2000 Standout
4Pi-Confocal Microscopy Provides Three-Dimensional Images of the Microtubule Network with 100- to 150-nm Resolution
1998 StandoutNobel
Coherent use of opposing lenses for axial resolution increase in fluorescence microscopy I Comparative study of concepts
2001 StandoutNobel
Ultra-High Resolution Imaging by Fluorescence Photoactivation Localization Microscopy
2006 Standout
4Pi-Confocal Imaging in Fixed Biological Specimens
1998 StandoutNobel
Fluorescence correlation spectroscopy with a total internal reflection fluorescence STED microscope (TIRF-STED-FCS)
2012 StandoutNobel
Polarization effects in 4Pi confocal microscopy studied with water-immersion lenses
2000 StandoutNobel
Cooperative 4Pi Excitation and Detection Yields Sevenfold Sharper Optical Sections in Live-Cell Microscopy
2004 StandoutNobel
QUANTITATIVE OPTICAL SPECTROSCOPY FOR TISSUE DIAGNOSIS
1996
Luminescence properties of defects in GaN
2005 Standout
Pulsed laser fluorophore deposition: a method for measuring the axial resolution in two-photon fluorescence microscopy
1995 StandoutNobel
Three-dimensional transfer functions in 4Pi confocal microscopes
1994
Phase filter enhanced STED-4Pi fluorescence microscopy: theory and experiment
2005 StandoutNobel
Differences in radical generation due to chemical bonding of gas molecules in a high-density fluorocarbon plasma: Effects of the C=C bond in fluorocarbon gases
1999
Comparison of three‐dimensional imaging properties between two‐photon and single‐photon fluorescence microscopy
1995
Two-Photon Oxygen Sensing with Quantum Dot-Porphyrin Conjugates
2013 StandoutNobel
Surface photovoltage phenomena: theory, experiment, and applications
1999 Standout
Evaluation of Oxalyl Fluoride for a Dielectric Etch Application in an Inductively Coupled Plasma Etch Tool
2001 StandoutNobel
Live tissue intrinsic emission microscopy using multiphoton-excited native fluorescence and second harmonic generation
2003 Standout
Band Bending in Semiconductors: Chemical and Physical Consequences at Surfaces and Interfaces
2012 Standout
Near-field photoconductivity: Application to carrier transport in InGaAsP quantum well lasers
1994 StandoutNobel
New radical control method for high-performance dielectric etching with nonperfluorocompound gas chemistries in ultrahigh-frequency plasma
1999
Electric field depolarization in high aperture focusing with emphasis on annular apertures
2000 StandoutNobel
Confocal fluorescent microscopy with a finite-sized circular detector
1992
GaAs, AlAs, and AlxGa1−xAs: Material parameters for use in research and device applications
1985 Standout
Improved axial resolution in confocal fluorescence microscopy using annular pupils
1994
Secondary electron emission in the scanning electron microscope
1983 Standout
Fast 100-nm resolution three-dimensional microscope reveals structural plasticity of mitochondria in live yeast
2002 StandoutNobel
Single sharp spot in fluorescence microscopy of two opposing lenses
2001 StandoutNobel
Surface photovoltage phase spectroscopy – a handy tool for characterisation of bulk semiconductors and nanostructures
2006
Electronic properties of random alloys: Special quasirandom structures
1990 Standout
Activatable Photosensitizers for Imaging and Therapy
2010 Standout
Two-Photon Absorbing Nanocrystal Sensors for Ratiometric Detection of Oxygen
2009 StandoutNobel
Persistence and Amalgamation Types in the Electronic Structure of Mixed Crystals
1968
Three-dimensional optical transfer function in a fiber-optical confocal fluorescence microscope using annular lenses
1992
Optical transfer functions of 4Pi confocal microscopes: theory and experiment
1997 StandoutNobel
Visible-light driven heterojunction photocatalysts for water splitting – a critical review
2015 Standout
Confocal scanning optical microscope using single-mode fiber for signal detection
1991
Minority Carrier Transport in Lead Sulfide Quantum Dot Photovoltaics
2017 StandoutNobel
Raman scattering in AlxGa1−xN alloys
1991 StandoutNobel
Long wavelength optical phonons in mixed crystals
1971
Annular aperture two-photon excitation microscopy
1995 StandoutNobel
Background rejection and signal-to-noise optimization in confocal and alternative fluorescence microscopes
1994
Three-dimensional super-resolution with a 4Pi-confocal microscope using image restoration
1998 StandoutNobel
Photoionization of Individual CdSe/CdS Core/Shell Nanocrystals on Silicon with 2-nm Oxide Depends on Surface Band Bending
2003 StandoutNobel
Charge collection scanning electron microscopy
1982
Quantitative comparison of background rejection, signal-to-noise ratio, and resolution in confocal and full-field laser scanning microscopes
1995
Single Nanocrystal Spectroscopy of Shortwave Infrared Emitters
2018 StandoutNobel
Resolving fluorescence beads at 100–200 nm axial distance with a two-photon 4Pi-microscope operating in the near infrared
1995 StandoutNobel
Reliability of Nickel Inner Electrode Lead-Free Multilayer Piezoelectric Ceramics
2012
Perovskite lead-free dielectrics for energy storage applications
2018 Standout
Surface photovoltage spectroscopy of semiconductor structures: at the crossroads of physics, chemistry and electrical engineering
2001
Works of Chusuke Munakata being referenced
Effect of the Surface Recombination Velocity on the β-Conductive Signal
1972
Observation of Ring-Distributed Microdefects in Czochralski-Grown Silicon Wafers with a Scanning Photon Microscope and Its Diagnostic Application to Device Processing
1992
An Electron Beam Method of Measuring Deffusion Voltage in Semiconductors
1967
Analysis of the β-Conductive Signal Excited with a Pulsed Electron Beam
1972
Excitation-Power-Density Dependent ac Surface Photovoltages in Radiation-Damaged Si Wafer
1984
Measurement of the Homogenity of a Semiconductor with an Electron Beam
1965
Determination of Surface Charge and Interface Trap Densities in Naturally Oxidized n-Type Si wafers Using ae Surface Photovoltages
1987
Ac Surface Photovoltages in p-Type Silicon Wafers Oxidized in Water-Free and Wet Ambients
1988
Measurement of minority carrier lifetime with a non-ohmic contact and an electron beam
1966
Measurement of Resistance by Means of Electron Beam -III-
1969
Phosphorus-induced positive charge in native oxide of silicon wafers
1994
Calculation of three-dimensional optical transfer function for a confocal scanning fluorescent microscope
1989
Frequency Response of the Strong Inversion Layer in a Silicon Wafer
1983
Nondestructive Measurement of Minority Carrier Lifetimes in Si Wafers Using Frequency Dependence of ac Photovoltages
1986
Observation of p-n Junctions with a Flying-Spot Scanner Using a Chopped Photon Beam
1982
Comparison of Minority Carrier Lifetimes Measured by Photoconductive Decay and ac Photovoltaic Method
1988
Measurement of Resistance by Means of Electron Beam –II–
1966
Scanning electron micrograph using beta-conductive signal
1969
An application of beta conductivity to measurement of resistivity distribution
1968
Density Distribution of a Mercury Plasma near an Anchored Cathode Spot
1965
Nondestructive diagnostic method using ac surface photovoltage for detecting metallic contaminants in silicon wafers
1993
On the Voltage Induced by an Electron Beam in a Bulk Semiconductor Crystal
1966
Nondestructive Observations of Surface Flaws and Contaminations in Silicon Wafers by Means of a Scanning Photon Microscope
1988
Dependence of 3-D optical transfer functions on the pinhole radius in a fluorescent confocal optical microscope
1990
Analysis of ac Surface Photovoltages in a Depleted Oxidized p-Type Silicon Wafer
1986
The photovoltaic observation of semiconductor surfaces
1983
Ac Surface Photovoltages in Strongly-Inverted Oxidized p-Type Silicon Wafers*
1984
Detection of Resistivity Striations in a Ge Crystal with an Electron Beam
1966
Frequency Dependence of the Diffusion Length for Excess Minority Carriers Generated with a Pulsed Electron Beam
1972
Calibration of Minority Carrier Lifetimes Measured with an ac Photovoltaic Method
1988
An Electron Beam Method of Measuring Resistivity Distribution in Semiconductors
1967
Improvement of the $\beta$-conductive method of measuring electric field intensity in semiconductors by a pulsed electron beam
1972
A Method of Measuring Lifetime for Minority Carriers Induced by an Electron Beam in Germanium
1966
Density Distribution Profiles of Excess Minority Carriers Injected with 904-nm-Wavelength Laser Pulse into 400-µm-Thick Silicon Wafer
2005
Three-dimensional optical transfer function for the fluorescent scanning optical microscope with a slit
1990
Simplified AC Photovoltaic Measurement of Minority Carrier Lifetime in Czochralski-Grown Silicon Wafers Having Ring-Distributed Stacking Faults
1993
The Photovoltaic Observation of a Non-Conductive Layer due to BN Formed in a Boron Implanted Si Junction
1982
Measurement of Potential Distribution in a Semiconductor Crystal with an Electron Beam
1967
Analysis of ac Surface Photovoltages in Accumulation Region
1988
Detection of resistivity variation in a semiconductor pellet with an electron beam
1967
A scanning photon microscope for non-destructive observations of crystal defect and interface trap distributions in silicon wafers
1988