Immediate Impact
5 hit
Citing Papers
Radiation-Induced Soft Errors in Advanced Semiconductor Technologies
2005 Hit
Characterization of soft errors caused by single event upsets in CMOS processes
2004 Hit
Works of Changhong Dai being referenced
Impact of CMOS process scaling and SOI on the soft error rates of logic processes
2002
Alpha-SER modeling and simulation for sub-0.25 /spl mu/m CMOS technology
1999