Citation Impact
Citing Papers
Radiation-induced soft errors in advanced semiconductor technologies
2005 Standout
Basic mechanisms and modeling of single-event upset in digital microelectronics
2003 Standout
Single particle-induced latchup
1996
Works of C. Sudre being referenced
SEU critical charge and sensitive area in a submicron CMOS technology
1997
The latchup risk of CMOS-technology in space
1993