C. Flink

Atomic Layer Deposition Chemistry: Recent Developments and Future Challenges

Engineering metal-impurity nanodefects for low-cost solar cells

First-principles calculations for point defects in solids

Room-Temperature Phosphorescence and Low-Energy Induced Direct Triplet Excitation of Alq₃ Engineered Crystals

Luminescence properties of defects in GaN

Impact of Iron Precipitates on Carrier Lifetime in As-Grown and Phosphorus-Gettered Multicrystalline Silicon Wafers in Model and Experiment

Surface photovoltage phenomena: theory, experiment, and applications

Atomic Layer Deposition: An Overview

Metal content of multicrystalline silicon for solar cells and its impact on minority carrier diffusion length

Band Bending in Semiconductors: Chemical and Physical Consequences at Surfaces and Interfaces

Quantifying the effect of metal-rich precipitates on minority carrier diffusion length in multicrystalline silicon using synchrotron-based spectrally resolved x-ray beam-induced current

Studies of metallic thin film growth in an atomic layer epitaxy reactor using M(acac)2 (M=Ni, Cu, Pt) precursors

Surface chemistry of atomic layer deposition: A case study for the trimethylaluminum/water process

Applications of Synchrotron-Based X-ray Microprobes

Thermodynamics of impurities in semiconductors

Improving the Carrier Lifetime of Tin Sulfide via Prediction and Mitigation of Harmful Point Defects

X27A—A new hard X-ray micro-spectroscopy facility at the National Synchrotron Light Source

Visible-light driven heterojunction photocatalysts for water splitting – a critical review

Building intuition of iron evolution during solar cell processing through analysis of different process models

High Tolerance to Iron Contamination in Lead Halide Perovskite Solar Cells

Electrical and Recombination Properties of Copper‐Silicide Precipitates in Silicon

Intrinsic Diffusion Coefficient of Interstitial Copper in Silicon

Metal impurity precipitates in silicon: chemical state and stability

Influence of interstitial copper on diffusion length and lifetime of minority carriers in p-type silicon

Interstitial copper-related center in n-type silicon

Synchrotron-based impurity mapping

Thermal stability of copper precipitates in silicon