Benjamin Ballard

Prepare dispersed CIS nano-scale particles and spray coating CIS absorber layers using nano-scale precursors

A review of catalysts for the electroreduction of carbon dioxide to produce low-carbon fuels

Molybdenum, Molybdenum Oxides, and their Electrochemistry

Residual stress. Part 1 – Measurement techniques

Laser material processing

Prospects of Colloidal Nanocrystals for Electronic and Optoelectronic Applications

Blue Light Emitting Defective Nanocrystals Composed of Earth‐Abundant Elements

Synthesis of CuInS₂, CuInSe₂, and Cu(In_xGa_1-x)Se₂(CIGS) Nanocrystal “Inks” for Printable Photovoltaics

Changes of microstructure and mechanical properties of cold-rolled low carbon steel due to its surface treatment by Nd:glass pulsed laser

Overcoming Efficiency Limitations of SnS‐Based Solar Cells

Thin-film Sb2Se3 photovoltaics with oriented one-dimensional ribbons and benign grain boundaries

Stress analysis of polycrystalline thin films and surface regions by X-ray diffraction

Blue Light Emitting Defective Nanocrystals Composed of Earth‐Abundant Elements

Analysis of thin film stress measurement techniques

Improving the Carrier Lifetime of Tin Sulfide via Prediction and Mitigation of Harmful Point Defects

Minority Carrier Transport in Lead Sulfide Quantum Dot Photovoltaics

Effect of sputtering process parameters on film properties of molybdenum back contact

Electrodeposition of CIS films on the Mo back electrodes with different crystallinities

Control of the Preferred Orientation of Cu(In,Ga)Se₂Thin Film by the Surface Modification of Mo Film

A review on the state-of-the-art technologies of electric vehicle, its impacts and prospects

Lithium metal anodes for rechargeable batteries

Depth Profiling Biaxial Stresses in Sputter Deposited Molybdenum Films; Use of the Cos²φ Method

Proposed Methods for Depth Profiling of Residual Stresses using Grazing Incidence X-Ray Diffraction (GIXD)

Sputtered molybdenum bilayer back contact for copper indium diselenide-based polycrystalline thin-film solar cells

Stress-Depth Profiles in Magnetron Sputtered Mo Films Using Grazing Incidence X-Ray Diffraction (GIXD)