Citation Impact
Citing Papers
Memristive devices for computing
2012 Standout
Liquid crystal display and organic light-emitting diode display: present status and future perspectives
2017 Standout
Effects of radiation and charge trapping on the reliability of high- κ gate dielectrics
2004
High-Performance Single Layered WSe2 p-FETs with Chemically Doped Contacts
2012 Standout
Physically unclonable function using CMOS breakdown position
2017
A Review of LED Drivers and Related Technologies
2017 Standout
Low field leakage current and soft breakdown in ultra-thin gate oxides after heavy ions, electron or X-ray irradiation
2000
Total ionizing dose effects in MOS oxides and devices
2003 Standout
Near‐Unity Superradiant Emission from Delocalized Frenkel Excitons in a Two‐Dimensional Supramolecular Assembly
2022 StandoutNobel
Characterization, modeling, and analysis of organic light-emitting diodes with different structures
2015
Thermochemical resistive switching: materials, mechanisms, and scaling projections
2011
Physical unclonable functions
2020 Standout
Degradation Mechanisms and Reactions in Organic Light-Emitting Devices
2015
Nonfullerene Acceptor Molecules for Bulk Heterojunction Organic Solar Cells
2018 Standout
Review: Fullerene based acceptors for efficient bulk heterojunction organic solar cell applications
2016
A model of radiation induced leakage current (RILC) in ultra-thin gate oxides
1999
Observation of latent reliability degradation in ultrathin oxides after heavy-ion irradiation
2002
Long-term reliability degradation of ultrathin dielectric films due to heavy-ion irradiation
2002
Radiation-induced leakage currents: atomic scale mechanisms
2001
Heavy ion irradiation of thin gate oxides
2000
Fundamentals of Modern VLSI Devices
2009 Standout
Radiation Effects in MOS Oxides
2008 Standout
Successive Oxide Breakdown Statistics: Correlation Effects, Reliability Methodologies, and Their Limits
2004
The integration of high-k dielectric on two-dimensional crystals by atomic layer deposition
2012
Heavy-ion-induced soft breakdown of thin gate oxides
2001
Works of Andrea Cester being referenced
Time stability of Stress Induced Leakage Current in thin gate oxides
1999
Post-radiation-induced soft breakdown conduction properties as a function of temperature
2001
Effects of Positive and Negative Stresses on III–V MOSFETs With $\hbox{Al}_{2}\hbox{O}_{3}$ Gate Dielectric
2011
Collapse of MOSFET drain current after soft breakdown and its dependence on the transistor aspect ratio W/L
2003
Accelerated wear-out of ultra-thin gate oxides after irradiation
2003
Radiation induced leakage current and stress induced leakage current in ultra-thin gate oxides
1998
Total dose dependence of radiation-induced leakage current in ultra-thin gate oxides
1999
Noise characteristics of radiation-induced soft breakdown current in ultrathin gate oxides
2001
Study of the effect of stress-induced trap levels on OLED characteristics by numerical model
2012
A novel approach to quantum point contact for post soft breakdown conduction
2002
Thermal and electrical stress effects of electrical and optical characteristics of Alq3/NPD OLED
2010
Characterization and modeling of organic (P3HT:PCBM) solar cells as a function of bias and illumination
2016
Impact of Trapped Charge and Interface Defects on the Degradation of the Optical and Electrical Characteristics in $\hbox{NPD/Alq}_{3}$ OLEDs
2009