A.B. Campbell

122 papers · 2.3k indexed citations

Citation Impact

Citing Papers

4Pi-Confocal Microscopy Provides Three-Dimensional Images of the Microtubule Network with 100- to 150-nm Resolution

1998 StandoutNobel

Broad-Spectrum Antibiotic or G-CSF as Potential Countermeasures for Impaired Control of Bacterial Infection Associated with an SPE Exposure during Spaceflight

2015 StandoutNobel

Single-event current transients induced by high energy ion microbeams

1993

Effects of radiation and charge trapping on the reliability of high- κ gate dielectrics

2004

Intrinsic SEU Reduction from Use of Heterojunctions in Gallium Arsenide Bipolar Circuits

1987

Radiation-induced soft errors in advanced semiconductor technologies

2005 Standout

Single-event-induced charge collection and direct channel conduction in submicron MOSFETs

1994

Total dose failures in advanced electronics from single ions

1993

The design of radiation-hardened ICs for space: a compendium of approaches

1988

Cosmic ray soft error rates of 16-Mb DRAM memory chips

1998

Basic mechanisms and modeling of single-event upset in digital microelectronics

2003 Standout

Radiation detector materials: An overview

2008

Soft Errors Due to Protons in the Radiation Belt

1981

SEU-hardened resistive-load static RAMs

1991

A digital CMOS design technique for SEU hardening

2000

Two-Dimensional Simulation of Single Event Indujced Bipolar Current in CMOS Structures

1984

Electric currents through ion tracks in silicon devices

1998

Low field leakage current and soft breakdown in ultra-thin gate oxides after heavy ions, electron or X-ray irradiation

2000

Total ionizing dose effects in MOS oxides and devices

2003 Standout

Single-event effects in SOI technologies and devices

1996

SEU-hardened storage cell validation using a pulsed laser

1996

Metal–Organic Framework Materials as Chemical Sensors

2011 Standout

Evidence for angular effects in proton-induced single-event upsets

2002

Time-resolved ion beam induced charge collection (TRIBICC) in micro-electronics

1998

Experimental Evidence for a New Single-Event Upset (SEU) Mode in a CMOS SRAM Obtained from Model Verification

1987

Analysis of single-event effects in combinational logic-simulation of the AM2901 bitslice processor

2000

Implementing QML for radiation hardness assurance

1990

Critical charge concepts for CMOS SRAMs

1995

Soft error protection using asymmetric response latches

1991

Cosmic and terrestrial single-event radiation effects in dynamic random access memories

1996

Single-event upset and snapback in silicon-on-insulator devices and integrated circuits

2000

Comparison of error rates in combinational and sequential logic

1997

Memory System Design for Tolerating Single Event Upsets

1983

Proton and Heavy-Ion Radiation Damage Studies in MOS Transistors

1985

Chemical profile and magnetoresistance ofGa1−xMnxAs/GaAs/AlAs/GaAs/Ga1−xMnxAstunnel junctions

2005 StandoutNobel

Charge collection and SEU from angled ion strikes

1997

Single particle-induced latchup

1996

A comparison of SEU tolerance in high-speed SiGe HBT digital logic designed with multiple circuit architectures

2002

Millimeter-Wave Technology for Automotive Radar Sensors in the 77 GHz Frequency Band

2012 Standout

Microbeam studies of single-event effects

1996

Total ionizing dose effects in bipolar devices and circuits

2003

Three-dimensional numerical simulation of single event upset of an SRAM cell

1993

MEMS reliability from a failure mechanisms perspective

2003

Single Event Upset in SOS Integrated Circuits

1987

Precursor ion damage and angular dependence of single event gate rupture in thin oxides

1998

Lest we remember

2009 Standout

Charge collection in SOI capacitors and circuits and its effect on SEU hardness

2002

Device simulation of charge collection and single-event upset

1996

Investigation of single-event upset (SEU) in an advanced bipolar process

1988

Charge Funneling in N- and P-Type Si Substrates

1982

A model of radiation induced leakage current (RILC) in ultra-thin gate oxides

1999

Cost-effective numerical simulation of SEU

1988

Three-dimensional simulation of charge collection and multiple-bit upset in Si devices

1994

Single-word multiple-bit upsets in static random access devices

1993

Single event mirroring and DRAM sense amplifier designs for improved single-event-upset performance

1994

Using Nanowires To Extract Excitons from a Nanocrystal Solid

2011 StandoutNobel

CMOS VLSI single event transient characterization

1989

Proton Upsets in Orbit

1983

Soft error susceptibility and immune structures in dynamic random access memories (DRAMs) investigated by nuclear microprobes

1996

Nitrogen in germanium

1998

Memory SEU simulations using 2-D transport calculations

1985

Heavy ion irradiation of thin gate oxides

2000

Whole-body irradiation and long-term modification of bone marrow-derived cell populations by low- and high-LET radiation.

2007

On the suitability of non-hardened high density SRAMs for space applications

1991

Radiation effects in SOI technologies

2003

Radiation Effects in MOS Oxides

2008 Standout

Analysis of radiation effects on individual DRAM cells

2000

Destructive single-event effects in semiconductor devices and ICs

2003

The space radiation environment for electronics

1988 Standout

SEU-sensitive volumes in bulk and SOI SRAMs from first-principles calculations and experiments

2001

On the Potential of SiGe HBTs for Extreme Environment Electronics

2005

Low-temperature molecular beam epitaxial growth of GaAs and (Ga,Mn)As

1999

Neutron irradiation effects on AlGaAs/GaAs heterojunction bipolar transistors

1988 StandoutNobel

Heavy-ion-induced breakdown in ultra-thin gate oxides and high-k dielectrics

2001

Upset hardened memory design for submicron CMOS technology

1996 Standout

Radiation effects in advanced microelectronics technologies

1998

Works of A.B. Campbell being referenced

Single event effects in circuit-hardened SiGe HBT logic at gigabit per second data rates

2000

Laser probing of bipolar amplification in 0.25-/spl mu/m MOS/SOI transistors

2000

Experimental and Theoretical Study of Alpha Particle Induced Charge Collection in GaAs FETS

1987

Ion induced charge collection in GaAs MESFETs

1989

Charge Collection in Test Structures

1983

Implications of the spatial dependence of the single-event-upset threshold in SRAMs measured with a pulsed laser

1994

SEU flight data from the CRRES MEP

1991

Charge-collection mechanisms of heterostructure FETs

1994

Significant reduction in the soft error susceptibility of GaAs field-effect transistors with a low-temperature grown GaAs buffer layer

1995

Enhanced low dose rate sensitivity (ELDRS) of linear circuits in a space environment

1999

Non-random single event upset trends

1989

Fast charge collection in GaAs MESFETs

1990

Quantification of the Memory Imprint Effect for a Charged Particle Environment

1987

Laser Simulation of Single Event Upsets

1987

Charge Transport by the Ion Shunt Effect

1986

Modification of single event upset cross section of an SRAM at high frequencies

1996

Analysis of multiple bit upsets (MBU) in CMOS SRAM

1996

Correlated Proton and Heavy Ion Upset Measurements on IDT Static RAMs

1985

Charge Collection Measurements for Energetic Ions in Silicon

1982

Charge collection in silicon for ions of different energy but same linear energy transfer (LET)

1988

Observation of the solar particle events of October and November 2003 from CREDO and MPTB

2004

Charge collection in submicron CMOS/SOI technology

1997

Single Event Upsets in NMOS Microprocessors

1981

Single Event Upsets in RAMs Induced by Protons at 4.2 GeV and Protons and Neutrons below 100 MeV

1980

Charge Collection Efficiency Related to Damage in MOS Capaciors

1987

Comparison of experimental charge collection waveforms with PISCES calculations

1991

Effect of ion energy upon dielectric breakdown of the capacitor response in vertical power MOSFETs

1998

Single event induced charge transport modeling of GaAs MESFETs

1993

Characterization of LT GaAs carrier lifetime in multilayer GaAs epitaxial wafers by the transient reflectivity technique

1997

Low temperature proton induced upsets in NMOS resistive load static RAM

1988

Use of an Ion Microbeam to Study Single Event Upsets in Microcircuits

1981

Investigation of soft upsets in MOS memories with a microbeam

1981

Single Event Upset Measurements of Gaas E-JFET RAMS

1983

Pulsed laser-induced SEU in integrated circuits: a practical method for hardness assurance testing

1990

Critical evaluation of the pulsed laser method for single event effects testing and fundamental studies

1994

Charge Collection in CMOS/SOS Structures

1985

Charge Collection in Multilayer Structures

1984

Charge Collection in Bipolar Transistors

1987

Ion Track Shunt Effects in Multi-Junction Structures

1985

Investigations of single-event upsets and charge collection in micro-electronics using variable-length laser-generated charge tracks

1998

Nitrogen Implanted Germanium: Damage, Lattice Location, and Electrical Properties

1975

Charge Collection in Ga/Aa Test Structures

1984

Charge collection from focussed picosecond laser pulses

1988

First observations of enhanced low dose rate sensitivity (ELDRS) in space: One part of the MPTB experiment

1998

The effects of radiation on MEMS accelerometers

1996

Rise time spectroscopy of nuclear radiations in a CsI(Tl) scintillator

1989

Proton-Induced Single Event Upsets in NMOS Microprocessors

1982

Alpha-, boron-, silicon- and iron-ion-induced current transients in low-capacitance silicon and GaAs diodes

1988

Single Event Upset Dependence on Temperature or an NMOS/Resistive-Load Static RAM

1986