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Citing Papers
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Anomalous vibrational linebroadening of the v1 mode in CH2Cl2/CD2Cl2 mixtures
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Correction of finite slit width effects on Raman line widths
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Near-field probing of vibrational absorption for chemical microscopy
1999 Nature
Imaging Schottky Barriers and Ohmic Contacts in PbS Quantum Dot Devices
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Minimal-data approaches for determining outer-layer dielectric responses of films from kinetic reflectometric and ellipsometric measurements
1993
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Direct biofunctionalization of semiconductors: A survey
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Exploitation of Localized Surface Plasmon Resonance
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Optical properties of gallium oxide thin films
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Works of A. Röseler being referenced
Calculation of the spectral slit widths of infrared prism spectrophotometers for different slit illuminations with the aid of the contrast transmission function
1965
Surface-Enhanced Infrared Absorption: Infrared Ellipsometry of Au Evaporated Ultrathin Organic Films
2008
Measured characteristics of infrared edge radiation from BESSY II
2000
IR ellipsometry of the highly anisotropic materials α-SiO2 and α-Al2O3
1993
IR spectroscopic ellipsometry: instrumentation and results
1993
Optical resonances of indium islands on GaAs(001) observed by reflectance anisotropy spectroscopy
2003
Infrared Ellipsometry of Langmuir−Blodgett Films on Gold. Toward Interpreting the Molecular Orientation
2002
The optical constants of metallic island films as used for surface enhanced infrared absorption
1998
Infrared ellipsometric analysis of organic film-on-substrate samples
1998
Infrared-Optical Characterization of Metallic Island Films
1997
Spectroscopic ellipsometry in the infrared
1981
Spectroscopic infrared ellipsometry to determine the structure of layered samples
2002
Infrared ellipsometric study on the initial stages of oxide growth on Si(001)
2004
Fourier Transform Infrared Synchrotron Ellipsometry for Studying the Anisotropy of Small Organic Samples
2003
Characterization of chemically prepared Si-surfaces by uv-vis and IR spectroscopic ellipsometry and surface photovoltage
1997
Use of the gauss curve as slit function for the measurement of absolute absorption intensities in the infrared spectral region
1965
Surface enhanced infrared absorption observed with attenuated total reflection (ATR-SEIRA): modeling the optical response
1998
Ellipsometry with fourier transform spectrometer: An application to TaSi2 films
1991
Reflection anomalies related to n=1
2006
Problem of polarization degree in spectroscopic photometric ellipsometry (polarimetry)
1992
Structure analysis of organic films by mid-infrared ellipsometry
2004
New infrared spectroscopic beamline at BESSY II
2002
Infrared spectroscopic ellipsometry and atomic force microscopy study of plasma polymerized hexamethyldisiloxane layers post-treated by NH3 plasma
2005
Wet-chemical preparation and spectroscopic characterization of Si interfaces
2004
Spectroscopic investigations of hydrogen termination, oxide coverage, roughness, and surface state density of silicon during native oxidation in air
2002