A. Ochoa

Radiation-induced soft errors in advanced semiconductor technologies

Status of silicon carbide (SiC) as a wide-bandgap semiconductor for high-temperature applications: A review

The design of radiation-hardened ICs for space: a compendium of approaches

Basic mechanisms and modeling of single-event upset in digital microelectronics

SEU-hardened resistive-load static RAMs

A digital CMOS design technique for SEU hardening

Comparison of Neutron, Proton and Gamma Ray Effects in Semiconductor Devices

High-temperature silicon-on-insulator electronics for space nuclear power systems: requirements and feasibility

Simulated SEU hardened scaled CMOS SRAM cell design using gated resistors

Critical charge concepts for CMOS SRAMs

Low power SEU immune CMOS memory circuits

SEU hardened memory cells for a CCSDS Reed-Solomon encoder

Single particle-induced latchup

An SEU-hardened CMOS data latch design

Radiation Effects in MOS Oxides

Destructive single-event effects in semiconductor devices and ICs

The space radiation environment for electronics

Upset hardened memory design for submicron CMOS technology

Latch-Up Elimination in Bulk CMOS LSI Circuits

A proposed new structure for SEU immunity in SRAM employing drain resistance

Comparison of Analytical Models and Experimental Results for Single Event Upset in CMOS SRAMs

Error Analysis and Prevention of Cosmic Ion-Induced Soft Errors in Static CMOS RAMs

Snap-Back: A Stable Regenerative Breakdown Mode of MOS Devices

An SEU Tolerant Memory Cell Derived from Fundamental Studies of SEU Mechanisms in SRAM