A. Bravaix

Ionizing radiation induced leakage current on ultra-thin gate oxides

Effects of interface traps and border traps on MOS postirradiation annealing response

Total ionizing dose effects in MOS oxides and devices

Power-Up SRAM State as an Identifying Fingerprint and Source of True Random Numbers

Fast and slow border traps in MOS devices

Physical Unclonable Functions and Applications: A Tutorial

Physical unclonable functions

Modeling attacks on physical unclonable functions

Radiation Effects in MOS Oxides

A coupled I(V) and charge-pumping analysis of Stress Induced Leakage Currents in 5nm-thick gate oxides

Charging and discharging properties of electron traps created by hot-carrier injections in gate oxide of n-channel metal oxide semiconductor field effect transistor

Interface Trap Generation and Hole Trapping Under NBTI and PBTI in Advanced CMOS Technology With a 2-nm Gate Oxide